Stressed Programmable Pattern Generation

Stressed Programmable Pattern Generation

Many signal integrtiy characterization measurements of serial data systems require a stressed pattern source. Centellax has eliminated the need for expensive stressed serial BERTs with our affordable, high-performance pattern generator solutions. The following features are key to characterizing electrical and optical serial data applications: 

• Stressed Eye Capabilities
• Pre-Loaded Patterns: PRBS, CJPAT, CRPAT, K28-X, etc.
• User Programmable Arbitrary Patterns up to 24 Mb
• Integrated De-Emphasis

Stressed Eye Capabilities

The combination of our PPG12500 and SCS16000 stressed clock synthesizer allows the user to apply sinusoidal jitter (SJ) and broadband true random jitter (RJ) to create a stressed eye for testing receivers. Simulate a jittered data signal to test your receiver's impaired data tolerance.

Choose the Stress Sources you Need

The SCS16000 clock source is optimal for signal integrity applications. The low intrinsic jitter synthesizer provides continuously settable clock frequencies from 0.5 to 16 GHz. We currently offer 2 models to choose from so you only need to pay for the stress sources you need:

• SCS16000: 16 Gb/s Stressed Clock Synthesizer is ideal for many optical serial data applications and provides a single tone of sinusoidal jitter settable over a wide range of frequencies and modulation depths to enable jitter tolerance testing.
• SCS16000J: 16 Gb/s Stressed Clock Synthesizer is perfect for the electrical serial data applications requiring more complex "stress recipes." The SCS16000J includes two independent sources of sinusoidal along with broadband true random jitter sources. In addition, all three clock outputs can be modulated with spread spectrum, with a deviation settable up to 10,000 ppm or 1%.

Integrated De-Emphasis

Our PPG12500 programmable pattern generator includes integrated two-tap de-emphasis signal conditioning. Commonly used in higher data rate systems to open eyes by counteracting high frequency loss in the channel, applying de-emphasis to the test signal is required for receiver testing.